Denigma: Roorda S et al., 1991

Structural relaxation and defect annihilation in pure amorphous silicon.

Authors: Roorda S; Sinke WC; Poate JM; Jacobson DC; Dierker S; Dennis BS; Eaglesham DJ; Spaepen F; Fuoss P

Journal: Physical review. B, Condensed matter
Volume: 44
Issue: 8
Pages: 3702-3725
Date: Aug. 15, 1991
PMID: 9999999

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Citation:

Roorda S, Sinke WC, Poate JM, Jacobson DC, Dierker S, Dennis BS, Eaglesham DJ, Spaepen F, Fuoss P (1991) Structural relaxation and defect annihilation in pure amorphous silicon. Physical review. B, Condensed matter 44: 3702-3725.

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Structural relaxation and defect annihilation in pure amorphous silicon.

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